Test Systems and Equipment Features

Features

GaN-based switcher ICs empower next-generation power products - issue 1/2020
There have been a number of disruptive advances in the power electronics community over the last 20 years....
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Linear voltage regulators operate at automotive temperatures
Designed for high reliability, high temperature applications, the CMT-Antares is Cissoid's latest regulator.
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Test Systems and Equipment Features

Setting a new standard for power semiconductors test and measurement - issue 4/2016	July, 28 2016
Continued improvements in the performance of power semiconductors drives demand for corresponding improvements in testing technology...
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Quantification of cracked areas in IGBT Modules - issue 4/2016	July, 28 2016
Degradation of the thermal conduction path is one of the most common failure mechanisms of power semiconductor modules....
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Challenges of Wide Bandgap Power Semiconductor testing - issue 8/2014	December, 15 2014
Devices based on Silicon Carbide (SiC) and Gallium Nitride (GaN) can switch at much higher frequencies and also have far lower leakage than Silicon, so at the same time as there is a need for sourcing higher voltages in testing there is also a need for greater current measurement sensitivity..
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Quality Test Systems for High-Power Semiconductors - issue 8/2013	December, 24 2013
With more than 30 years of experience, ABB designs and manufactures CE compliant customized test systems, covering the entire range of high-power semiconductor testing capabilities....
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