Test Systems and Equipment Features

Features

A New Approach to Circuit Breaker Design Using Silicon Carbide Switches - Nov 21
Mechanical circuit breakers can be low cost with minimal losses, but they operate slowly and wear out. Solid state versions overcome the problems and are becoming increasing viable as replacements at...
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Test Systems and Equipment Features

Modern Clamping Systems for Tests of Power Semiconductor Devices with 15 kN Force- Oct 2020	September, 30 2020
Power semiconductor devices have many parameters and characteristics that must be measured using specialised equipment. Design of such equipment must account for many factors such as reliability, flexibility, ergonomics, and attention to overall aesthetics....
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Setting a new standard for power semiconductors test and measurement - issue 4/2016	July, 28 2016
Continued improvements in the performance of power semiconductors drives demand for corresponding improvements in testing technology...
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Quantification of cracked areas in IGBT Modules - issue 4/2016	July, 28 2016
Degradation of the thermal conduction path is one of the most common failure mechanisms of power semiconductor modules....
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Challenges of Wide Bandgap Power Semiconductor testing - issue 8/2014	December, 15 2014
Devices based on Silicon Carbide (SiC) and Gallium Nitride (GaN) can switch at much higher frequencies and also have far lower leakage than Silicon, so at the same time as there is a need for sourcing higher voltages in testing there is also a need for greater current measurement sensitivity..
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Quality Test Systems for High-Power Semiconductors - issue 8/2013	December, 24 2013
With more than 30 years of experience, ABB designs and manufactures CE compliant customized test systems, covering the entire range of high-power semiconductor testing capabilities....
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